Extracting Improved Figures of Merit for Characterizing Nonlinear Devices using Multisine Excitation Signals

Evi Van Nechel (Speaker)

Activity: Talk or presentationTalk or presentation at a conference

Description

This paper proposes a technique for extracting multiple measurement-based figures of merit with a single measurement taken from 1 measurement setup. Separate estimates of the linear term, the noise term and the in-band and out-of-band nonlinear distortion allow to calculate the signal-to-noise and distortion ratio, noise power ratio, adjacent channel leakage power ratio, etc. Those are extracted in least squares sense for a class of modulated excitation signals resembling real communication signals like LTE. The proposed method allows to split the linear dynamics from the nonlinear distortion, resulting in improved measures that are closer to the actual definitions of these figures of merit. The new measurement approach is compared with the classical one. Experimental results validate the proposed technique.
Period15 Jun 2018
Event title91st ARFTG Microwave Measurement Conference
Event typeConference
LocationPhiladelphia, United States, Pennsylvania
Degree of RecognitionInternational