Mission Profile-Oriented Reliability Assessment of a GaN-based On-Board Charger

Activity: Talk or presentation › Talk or presentation at a conference


This paper aims to assess the lifetime of a Gallium Nitride
(GaN) power switch-based OnBoard Charger (OBC) of an
Electric Vehicle (EV). The analytical model of the OBC is
utilized to simulate Junction Temperature (𝑇􀯝 ), junction
temperature swings (ΔTj), as well as switching waveforms
of the drain-source voltage (𝑉ô€®œô€¯Œ) and switch current (𝐌ô€®œ ).
Subsequently, the electro-thermal data is applied to a
Mission Profile-Oriented Reliability Assessment Tool
(MREL) to predict the Mean Time Before Failure (MTBF) of
the OBC. The simulation results indicate a 100 parts per
million (ppm) failure at 11.4 years for the whole OBC
system, considering only GaN switch failures.
Period20 May 2024
Event title47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies
Event typeConference
LocationCrete, Greece
Degree of RecognitionInternational