Keymolen, A., Marchal, A., Heck, F., van den Elshout, B., Vandersteen, G., Jonckheer, J. & Lataire, J., 23 Jul 2023, The 18th edition of IEEE International Symposium on Medical Measurements and Applications: IEEE MeMeA 2023.IEEE, 6 p. 1570886676. (2023 IEEE International Symposium on Medical Measurements and Applications, MeMeA 2023 - Conference Proceedings).
Research output: Chapter in Book/Report/Conference proceeding › Conference paper