Accurate On Wafer Measurement of Phase and Amplitude of the Spectral Components of Incident and Scattered Voltage Waves at the Signal Pors of a Nonlinear Microwave Device

Jan Verspecht; Peter Debie; Alain Barel; Luc Martens

Accurate On Wafer Measurement of Phase and Amplitude of the Spectral Components of Incident and Scattered Voltage Waves at the Signal Pors of a Nonlinear Microwave Device

Jan Verspecht, Peter Debie, Alain Barel, Luc Martens

Research output: Chapter in Book/Report/Conference proceeding › Conference paper

Original language	English
Title of host publication	Proceedings IEEE MTT-S, 1995, pp. 1029-1032
Publication status	Published - 1995
Event	Unknown - Duration: 1 Jan 1995 → …

Conference

Conference	Unknown
Period	1/01/95 → …

Bibliographical note

Proceedings IEEE MTT-S, 1995, pp. 1029-1032

Cite this

@inproceedings{00752ecd446446ffa85107327693a043,

title = "Accurate On Wafer Measurement of Phase and Amplitude of the Spectral Components of Incident and Scattered Voltage Waves at the Signal Pors of a Nonlinear Microwave Device",

author = "Jan Verspecht and Peter Debie and Alain Barel and Luc Martens",

note = "Proceedings IEEE MTT-S, 1995, pp. 1029-1032; Unknown ; Conference date: 01-01-1995",

year = "1995",

language = "English",

booktitle = "Proceedings IEEE MTT-S, 1995, pp. 1029-1032",

}

TY - GEN

T1 - Accurate On Wafer Measurement of Phase and Amplitude of the Spectral Components of Incident and Scattered Voltage Waves at the Signal Pors of a Nonlinear Microwave Device

AU - Verspecht, Jan

AU - Debie, Peter

AU - Barel, Alain

AU - Martens, Luc

N1 - Proceedings IEEE MTT-S, 1995, pp. 1029-1032

PY - 1995

Y1 - 1995

M3 - Conference paper

BT - Proceedings IEEE MTT-S, 1995, pp. 1029-1032

T2 - Unknown

Y2 - 1 January 1995

ER -