Accurate On Wafer Measurements Of The Large-Signal Behavior Of A Nonlinear MicroWave Device

Jan Verspecht, Peter Debie, Alain Barel, Luc Martens

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)
Original languageEnglish
JournalUnknown Journal
Publication statusPublished - 1 Feb 1996

Bibliographical note

Revue HF, No. 2, 1996, pp. 35–45

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