Analysis of errors associated with photometric distance in goniophotometry

Valéry Ann Jacobs, Peter Blattner, Yoshi Ohno, Udo Krueger, Peter Hanselaer, Patrick Rombauts, Frank Schmidt

Research output: Chapter in Book/Report/Conference proceedingConference paperResearch

Original languageEnglish
Title of host publication28th CIE SESSION
PublisherCIE Central Bureau Vienna-A
Pages458
Number of pages461
Volume1
ISBN (Print)9783902842558
Publication statusPublished - 1 Jul 2015
Event28th Session of the CIE - Manchester, United Kingdom
Duration: 28 Jun 20154 Jul 2015

Publication series

NameProceedings of the 28th Session of the CIE, Manchester
Volume1

Conference

Conference28th Session of the CIE
Country/TerritoryUnited Kingdom
CityManchester
Period28/06/154/07/15

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