Characterization of Substrate Noise Impact on RF CMOS Integrated Circuits in Lightly Doped Substrates

Charlotte Soens; C. Crunelle; P. Wambacq; Gerd Vandersteen; S. Donnay; Yves Rolain; Maarten Kuijk; Alain Barel

Characterization of Substrate Noise Impact on RF CMOS Integrated Circuits in Lightly Doped Substrates

Charlotte Soens, C. Crunelle, P. Wambacq, Gerd Vandersteen, S. Donnay, Yves Rolain, Maarten Kuijk, Alain Barel

Research output: Chapter in Book/Report/Conference proceeding › Conference paper

10 Citations (Scopus)

Abstract

Analog and RF circuit performance in single-chip transceivers can severely suffer from coupling of digital switching noise to the silicon substrate To predict this performance degradation, a deeper understanding of the impact of substrate noise is absolutely necessary. Using measurements, this impact is studied as the cascade of an attenuation through the substrate from the source of substrate noise to the RF circuit and the propagation through the RF circuit to its output This approach has been validated with measurements on a 0.25 mum and a 0.18 mum CMOS low-noise. amplifier (LNA) and reveals insight in the mechanisms of impact of substrate noise on RF circuits. In addition, impact of a real digital circuit is measured on a 0.18 mum differential CMOS LNA

Original language	English
Title of host publication	20th IEEE Instrumentation and Measurement Technology Conference
Publisher	IEEE, 345 E 47TH ST, NEW YORK
Pages	1303-1308
Number of pages	6
ISBN (Print)	0-7803-7705-2
Publication status	Published - 20 May 2003
Event	Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet - Stockholm, Sweden Duration: 21 Sept 2009 → 25 Sept 2009

Conference

Conference	Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet
Country/Territory	Sweden
City	Stockholm
Period	21/09/09 → 25/09/09

Bibliographical note

IMTC/2003, Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference, Vail, Colorado, USA, 20-22 May, 2003, pp. 1303-1308

IWT151: A project of mixed-signals for 5GHz WPAN transceivers.
Kuijk, M.
1/01/02 → 31/12/05
Project: Fundamental

Cite this

@inproceedings{04569c6aaadb4f65b7d469a11c7b04ac,

title = "Characterization of Substrate Noise Impact on RF CMOS Integrated Circuits in Lightly Doped Substrates",

abstract = "Analog and RF circuit performance in single-chip transceivers can severely suffer from coupling of digital switching noise to the silicon substrate To predict this performance degradation, a deeper understanding of the impact of substrate noise is absolutely necessary. Using measurements, this impact is studied as the cascade of an attenuation through the substrate from the source of substrate noise to the RF circuit and the propagation through the RF circuit to its output This approach has been validated with measurements on a 0.25 mum and a 0.18 mum CMOS low-noise. amplifier (LNA) and reveals insight in the mechanisms of impact of substrate noise on RF circuits. In addition, impact of a real digital circuit is measured on a 0.18 mum differential CMOS LNA",

author = "Charlotte Soens and C. Crunelle and P. Wambacq and Gerd Vandersteen and S. Donnay and Yves Rolain and Maarten Kuijk and Alain Barel",

note = "IMTC/2003, Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference, Vail, Colorado, USA, 20-22 May, 2003, pp. 1303-1308; Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet ; Conference date: 21-09-2009 Through 25-09-2009",

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month = may,

day = "20",

language = "English",

isbn = "0-7803-7705-2",

pages = "1303--1308",

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}

Soens, C, Crunelle, C, Wambacq, P, Vandersteen, G, Donnay, S, Rolain, Y , Kuijk, M & Barel, A 2003, Characterization of Substrate Noise Impact on RF CMOS Integrated Circuits in Lightly Doped Substrates. in 20th IEEE Instrumentation and Measurement Technology Conference. IEEE, 345 E 47TH ST, NEW YORK, pp. 1303-1308, Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet, Stockholm, Sweden, 21/09/09.

TY - GEN

T1 - Characterization of Substrate Noise Impact on RF CMOS Integrated Circuits in Lightly Doped Substrates

AU - Soens, Charlotte

AU - Crunelle, C.

AU - Wambacq, P.

AU - Vandersteen, Gerd

AU - Donnay, S.

AU - Rolain, Yves

AU - Kuijk, Maarten

AU - Barel, Alain

N1 - IMTC/2003, Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference, Vail, Colorado, USA, 20-22 May, 2003, pp. 1303-1308

PY - 2003/5/20

Y1 - 2003/5/20

N2 - Analog and RF circuit performance in single-chip transceivers can severely suffer from coupling of digital switching noise to the silicon substrate To predict this performance degradation, a deeper understanding of the impact of substrate noise is absolutely necessary. Using measurements, this impact is studied as the cascade of an attenuation through the substrate from the source of substrate noise to the RF circuit and the propagation through the RF circuit to its output This approach has been validated with measurements on a 0.25 mum and a 0.18 mum CMOS low-noise. amplifier (LNA) and reveals insight in the mechanisms of impact of substrate noise on RF circuits. In addition, impact of a real digital circuit is measured on a 0.18 mum differential CMOS LNA

AB - Analog and RF circuit performance in single-chip transceivers can severely suffer from coupling of digital switching noise to the silicon substrate To predict this performance degradation, a deeper understanding of the impact of substrate noise is absolutely necessary. Using measurements, this impact is studied as the cascade of an attenuation through the substrate from the source of substrate noise to the RF circuit and the propagation through the RF circuit to its output This approach has been validated with measurements on a 0.25 mum and a 0.18 mum CMOS low-noise. amplifier (LNA) and reveals insight in the mechanisms of impact of substrate noise on RF circuits. In addition, impact of a real digital circuit is measured on a 0.18 mum differential CMOS LNA

M3 - Conference paper

SN - 0-7803-7705-2

SP - 1303

EP - 1308

BT - 20th IEEE Instrumentation and Measurement Technology Conference

PB - IEEE, 345 E 47TH ST, NEW YORK

T2 - Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet

Y2 - 21 September 2009 through 25 September 2009

ER -

Characterization of Substrate Noise Impact on RF CMOS Integrated Circuits in Lightly Doped Substrates

Abstract

Conference

Bibliographical note

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Projects

IWT151: A project of mixed-signals for 5GHz WPAN transceivers.

Cite this