Abstract
This paper presents a real-field charging profile-oriented optimal design approach. The proposed Design for Reliability (DfR) framework includes multi-objective optimization for selecting appropriate components, charging profile datasets (based on company charging session log), a virtual prototype platform consisting of system-level electrothermal models coupled with control functions, and reliability assessment models for lifetime metrics calculation. The results reveal that charging profiles significantly impact system wear-out failure. Meeting industry service target lifetime requirements may necessitate re-optimization of the charger system.
Original language | English |
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Pages | 1-2 |
Number of pages | 2 |
Publication status | Published - 19 May 2024 |
Event | 47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies - Greece, Crete, Greece Duration: 19 May 2024 → 23 May 2024 https://wocsdice-exmatec-2024.eventsadmin.com/Home/Welcome |
Conference
Conference | 47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies |
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Abbreviated title | (WOCSDICE-EXMATEC 2024) |
Country/Territory | Greece |
City | Crete |
Period | 19/05/24 → 23/05/24 |
Internet address |