Compressed sensing mm-wave SAR for non-destructive testing applications using side information

Mathias Becquaert, Cristofani Caldero Edison, Gokarna Pandey, Marijke Vandewal, Johan Stiens, Nikolaos Deligiannis

Research output: Chapter in Book/Report/Conference proceedingConference paper

7 Citations (Scopus)

Abstract

This paper evaluates the applicability of an innovative strategy for applying compressed Sensing (CS) on Synthetic Aperture Radar (SAR) imaging, in the mm-wave range, using prior or structural side information. The studied technique adds the side information to the conventional CS minimization problem using an l1-l1 minimization approach, allowing for lower sub-Nyquist sampling than standard CS predicts. The applicability of this strategy on ultra-wideband SAR measurements is tested through simulations and real Non-Destructive Testing (NDT) experiments on a 3D-printed polymer object.
Original languageEnglish
Title of host publicationIEEE Radar Conference 2016
PublisherIEEE
Pages1-5
Number of pages5
ISBN (Electronic)978-1-5090-0863-6
Publication statusPublished - May 2016
Event2016 IEEE Radar Conference, RadarConf 2016 - Philadelphia, United States
Duration: 2 May 20166 May 2016

Conference

Conference2016 IEEE Radar Conference, RadarConf 2016
CountryUnited States
CityPhiladelphia
Period2/05/166/05/16

Keywords

  • Compressed sensing
  • Synthetic Aperture Radar
  • Non-Destructive Testing

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