Condition Monitoring of SiC MOSFET Through Gate-oxide Degradation

Research output: Unpublished contribution to conference › Poster

Original language	English
Publication status	Unpublished - 6 Feb 2025
Event	Flanders Make Scientific Conference 2025 - Celestijnenlaan 200H, Leuven, Belgium Duration: 6 Feb 2025 → 6 Feb 2025

Conference	Flanders Make Scientific Conference 2025
Country/Territory	Belgium
City	Leuven
Period	6/02/25 → 6/02/25

Cite this

@conference{5f869878fa944a4f9ec9e8428f77ca4e,

title = "Condition Monitoring of SiC MOSFET Through Gate-oxide Degradation",

author = "Farzad Hosseinabadi and Sajib Chakraborty and Omar Hegazy",

year = "2025",

month = feb,

day = "6",

language = "English",

note = "Flanders Make Scientific Conference 2025 ; Conference date: 06-02-2025 Through 06-02-2025",

}