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DC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si Substrates
S. Yadav, A. Vais, R. Y. Elkashlan, L. Witters, K. Vondkar, Y. Mols, A. Walke, H. Yu, R. Alcotte, M. Ingels, P. Wambacq, R. Langer, B. Kunert, N. Waldron, B. Parvais, N. Collaert
Research output: Chapter in Book/Report/Conference proceeding › Conference paper
3
Citations
(Scopus)