DC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si Substrates

S. Yadav, A. Vais, R. Y. Elkashlan, L. Witters, K. Vondkar, Y. Mols, A. Walke, H. Yu, R. Alcotte, M. Ingels, P. Wambacq, R. Langer, B. Kunert, N. Waldron, B. Parvais, N. Collaert

Research output: Chapter in Book/Report/Conference proceedingConference paper

3 Citations (Scopus)

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