DC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si Substrates

S. Yadav, A. Vais, R. Y. Elkashlan, L. Witters, K. Vondkar, Y. Mols, A. Walke, H. Yu, R. Alcotte, M. Ingels, P. Wambacq, R. Langer, B. Kunert, N. Waldron, B. Parvais, N. Collaert

Research output: Chapter in Book/Report/Conference proceeding › Conference paper

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SRP19: Strategic Research Programme: Center for model-based system improvement - From Computer-Aided Engineering to Model-Aided Engineering
Vandersteen, G., Rolain, Y., Wambacq, P., Kuijk, M., Vandersteen, G., Rolain, Y., Wambacq, P. & Kuijk, M.
1/11/12 → 31/10/24
Project: Fundamental