Efficient Generation of X-Parameters Transistor Models by Sequential Sampling

Pawel Barmuta, Francesco Ferranti, Arkadiusz Lewandowski, Luc Knockaert, Dominique Schreurs

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)
Original languageEnglish
Pages (from-to)530-532
Number of pages3
JournalIEEE Microwave and Wireless Components Letters
Volume24
Issue number8
DOIs
Publication statusPublished - Aug 2014

Keywords

  • Behavioral modeling
  • computer simulation
  • sequential sampling
  • X-parameters

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