Electrical Double-Layer Capacitors: Evaluation of ageing phenomena during cycle life testing

Noshin Omar, Ahmadou Samba, Mohamed Abdel Monem, Yousef Firouz, Thierry Clement Coosemans, Peter Van Den Bossche, Joeri Van Mierlo, Justin Salminen, Grietus Mulder, Hamid Gualous

Research output: Contribution to journalArticlepeer-review

29 Citations (Scopus)

Abstract

This paper represents an assessment of the main ageing phenomena in electrical double-layer capacitors (EDLC). In this study the cycle life of the EDLC cells with a rated capacitance of 1600F has been investigated at different ambient temperatures and current rates. From the experimental results we can observe that the impact of the high ambient temperature is significant on the cycle life of the cells. Moreover, the results also show the negative impact of the current rate. The internal resistance tests showed that the increase of the resistance is much higher than the decrease of the capacitance. Thus, the ageing of the EDLC during cycling was clearly non-linear. Further the EIS measurements indicated the higher increase of the imaginary part of the impedance at low frequencies during cycling, which indicates the capacitance fade.
Original languageEnglish
Pages (from-to)509-522
JournalJournal of Applied Electrochemistry
Volume44
Issue number4
Early online date26 Oct 2013
Publication statusPublished - Apr 2014

Keywords

  • Electrical double-layer capacitor
  • Ageing
  • Internal resistance increase
  • Capacitance fade
  • EIS
  • Lifetime model

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