Error Assessment and Mitigation Methods in Transient Radar Method

Ali Pourkazemi; Salar Tayebi; Johan Stiens

doi:10.3390/s20010263

Error Assessment and Mitigation Methods in Transient Radar Method

Ali Pourkazemi, Salar Tayebi, Johan Stiens

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Abstract

Transient Radar Method (TRM) was recently proposed as a novel contact-free method for the characterization of multilayer dielectric structures including the geometric details. In this paper, we discuss and quantify the intrinsic and systematic errors of TRM. Also, solutions for mitigating these problems are elaborated extensively. The proposed solution for error correction will be applied to quantify experimentally the thickness of several single-layer dielectric structures with thicknesses varying from larger to smaller than the wavelength. We will show how the error correction method allows sub-wavelength thickness measurements around λ/5

Original language	English
Article number	263
Pages (from-to)	1-17
Number of pages	17
Journal	Sensors
Volume	20
Issue number	1
DOIs	https://doi.org/10.3390/s20010263
Publication status	Published - 3 Jan 2020

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10.3390/s20010263Licence: CC BY

sensors-20-00263-v2Final published version, 4.59 MBLicence: CC BY

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AB - Transient Radar Method (TRM) was recently proposed as a novel contact-free method for the characterization of multilayer dielectric structures including the geometric details. In this paper, we discuss and quantify the intrinsic and systematic errors of TRM. Also, solutions for mitigating these problems are elaborated extensively. The proposed solution for error correction will be applied to quantify experimentally the thickness of several single-layer dielectric structures with thicknesses varying from larger to smaller than the wavelength. We will show how the error correction method allows sub-wavelength thickness measurements around λ/5

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Error Assessment and Mitigation Methods in Transient Radar Method

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