Frequency Response Function Measurements in the Presence of Nonlinear Distortion

Research output: Chapter in Book/Report/Conference proceeding › Conference paper

Original language	English
Title of host publication	IFAC Symposium on System Identification (SYSID 2000), Santa Barbara, California, USA, 21-23 June 2000
Publication status	Published - 2000
Event	Unknown - Duration: 1 Jan 2000 → …

Conference	Unknown
Period	1/01/00 → …

IFAC Symposium on System Identification (SYSID 2000), Santa Barbara, California, USA, 21-23 June 2000

Cite this

@inproceedings{5d227adea25c42cca13595a5c83dfc8f,

title = "Frequency Response Function Measurements in the Presence of Nonlinear Distortion",

author = "Joannes Schoukens and Rik Pintelon and Yves Rolain and Tadeusz Dobrowiecki",

note = "IFAC Symposium on System Identification (SYSID 2000), Santa Barbara, California, USA, 21-23 June 2000; null ; Conference date: 01-01-2000",

year = "2000",

language = "English",

booktitle = "IFAC Symposium on System Identification (SYSID 2000), Santa Barbara, California, USA, 21-23 June 2000",

}

TY - GEN

T1 - Frequency Response Function Measurements in the Presence of Nonlinear Distortion

AU - Schoukens, Joannes

AU - Pintelon, Rik

AU - Rolain, Yves

AU - Dobrowiecki, Tadeusz

N1 - IFAC Symposium on System Identification (SYSID 2000), Santa Barbara, California, USA, 21-23 June 2000

PY - 2000

Y1 - 2000

M3 - Conference paper

BT - IFAC Symposium on System Identification (SYSID 2000), Santa Barbara, California, USA, 21-23 June 2000

Y2 - 1 January 2000

ER -