'GANDALF' - A Diagnosing Expert System for in Circuit Testing of Digital Components using Automated Computer Controlled Measurements and Non-Heuristic Techniques

Patrick Bakx, Leo Van Biesen

Research output: Chapter in Book/Report/Conference proceedingConference paperResearch

Original languageEnglish
Title of host publicationProceedings of the International Symposium on Expert Systems, IASTED 88, Geneva, Switserland, June 14-15, 1988, pp. 55-57
Publication statusPublished - 1988
EventUnknown -
Duration: 1 Jan 1988 → …

Conference

ConferenceUnknown
Period1/01/88 → …

Bibliographical note

Proceedings of the International Symposium on Expert Systems, IASTED 88, Geneva, Switserland, June 14-15, 1988, pp. 55-57

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