Identification of Linear Systems in the Presence of Nonlinear Distortions

Rik Pintelon; Joannes Schoukens

Identification of Linear Systems in the Presence of Nonlinear Distortions

Research output: Chapter in Book/Report/Conference proceeding › Conference paper

3 Citations (Scopus)

Original language	English
Title of host publication	IMTC/2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, Baltimore, Maryland, USA, May 1-4, 2000, pp. 879-884
Publication status	Published - 2000
Event	Unknown - Duration: 1 Jan 2000 → …

Conference

Conference	Unknown
Period	1/01/00 → …

Bibliographical note

IMTC/2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, Baltimore, Maryland, USA, May 1-4, 2000, pp. 879-884

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Cite this

@inproceedings{e20dca189064460b958d6345dff07a34,

title = "Identification of Linear Systems in the Presence of Nonlinear Distortions",

author = "Rik Pintelon and Joannes Schoukens",

note = "IMTC/2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, Baltimore, Maryland, USA, May 1-4, 2000, pp. 879-884; Unknown ; Conference date: 01-01-2000",

year = "2000",

language = "English",

booktitle = "IMTC/2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, Baltimore, Maryland, USA, May 1-4, 2000, pp. 879-884",

}

TY - GEN

T1 - Identification of Linear Systems in the Presence of Nonlinear Distortions

AU - Pintelon, Rik

AU - Schoukens, Joannes

N1 - IMTC/2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, Baltimore, Maryland, USA, May 1-4, 2000, pp. 879-884

PY - 2000

Y1 - 2000

M3 - Conference paper

BT - IMTC/2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, Baltimore, Maryland, USA, May 1-4, 2000, pp. 879-884

T2 - Unknown

Y2 - 1 January 2000

ER -