In-situ ellipsometric characterization of the growth of porous anisotropic nanocrystalline ZnO layers

P. Laha, M. Y. Nazarkin, A. V. Volkova, M. M. Simunin, H. Terryn, S. A. Gavrilov, J. Ustarroz

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Fingerprint

Dive into the research topics of 'In-situ ellipsometric characterization of the growth of porous anisotropic nanocrystalline ZnO layers'. Together they form a unique fingerprint.

Physics & Astronomy