In situ measurement of crystal surface dynamics in pure and contaminated solutions by Confocal Microscopy and Atomic Force Microscopy

Alexander Van Driessche, Mike Sleutel

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Impurities are omnipresent during crystallization from solution, both in the lab and in natural environments.
Unravelling the mechanisms of impurity effects during crystal growth contributes to the general understanding
of crystallization processes and our ability to control it. One way of obtaining information on the impurity
mechanisms is to observe the interaction of these foreign species with the growth sites in situ, if possible at a molecular level. At present several optical based techniques are being employed for this type of research. In this chapter, the application of two popular methods in the area of crystal growth observation, atomic force microscopy and confocal microscopy, will be discussed, pointing out the strong points of each technique illustrated with examples from literature and the authors own work. The aim of this chapter is to show experimentalists, venturing into the field of crystal growth, the wide array of research possibilities these techniques offer for exploring the intriguing world of impurity interactions with crystalline materials.
Original languageEnglish
Pages (from-to)919-941
JournalCrystal Research and Technology
Volume48
Issue number10
Publication statusPublished - 2013

Keywords

  • protein

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