Measurement and modeling of the sensitivity of LC-VCO’s to substrate noise perturbations

Stephane Bronckers; Gerd Vandersteen; Charlotte Soens; G. Van Der Plas; Yves Rolain

Measurement and modeling of the sensitivity of LC-VCO’s to substrate noise perturbations

Stephane Bronckers, Gerd Vandersteen, Charlotte Soens, G. Van Der Plas, Yves Rolain

Electricity

Research output: Chapter in Book/Report/Conference proceeding › Conference paper

3 Citations (Scopus)

Abstract

On-chip oscillators are very sensitive to substrate perturbations.
Both low-frequency and high-frequency distortions can ruin
the required spectral purity of the oscillator. This paper presents the
measurement and modeling results of the sensitivity of a 900MHz LCVoltage
Controlled Oscillator (LC-VCO) to substrate perturbations
in a frequency range from DC to 900MHz. Accurate measurement of
the sensitivity require various measurement setups to investigate different
impact fenomena. These measurements implies spectral analysis,
linear vectorial network analyzer measurements and time domain
measurements. The impact of substrate noise is modeled in a high
Ohmic 0.18um 1P6M CMOS technology. Below 10MHz, the impact
is dominated by the on-chip resistance of the VCO ground. Above
10MHz, the bond wires, parasitics of the on-chip inductor and the
off-chip decoupling capacitors determine the sensitivity to substrate
perturbations.

Original language	English
Title of host publication	IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
Publication status	Published - 1 May 2007
Event	Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet - Stockholm, Sweden Duration: 21 Sept 2009 → 25 Sept 2009

Conference

Conference	Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet
Country/Territory	Sweden
City	Stockholm
Period	21/09/09 → 25/09/09

Keywords

substrate noise
CMOS integrated circuit
voltage controlled oscillator
sensitivity
immunity

IEEE/IMTC 2007, the IEEE Instrumentation and Measurement Technology Conference
Laurent Vanbeylen (Speaker)
1 May 2007 → 3 May 2007
Activity: Talk or presentation › Talk or presentation at a conference
IEEE/IMTC 2007, the IEEE Instrumentation and Measurement Technology Conference
Rik Pintelon (Speaker)
1 May 2007 → 3 May 2007
Activity: Talk or presentation › Talk or presentation at a conference
IEEE/IMTC 2007, the IEEE Instrumentation and Measurement Technology Conference
Liesbeth Gomme (Speaker)
1 May 2007 → 3 May 2007
Activity: Talk or presentation › Talk or presentation at a conference

Cite this

@inproceedings{1828616a97384d44b13d24db57ac6408,

title = "Measurement and modeling of the sensitivity of LC-VCO{\textquoteright}s to substrate noise perturbations",

abstract = "On-chip oscillators are very sensitive to substrate perturbations. Both low-frequency and high-frequency distortions can ruin the required spectral purity of the oscillator. This paper presents the measurement and modeling results of the sensitivity of a 900MHz LCVoltage Controlled Oscillator (LC-VCO) to substrate perturbations in a frequency range from DC to 900MHz. Accurate measurement of the sensitivity require various measurement setups to investigate different impact fenomena. These measurements implies spectral analysis, linear vectorial network analyzer measurements and time domain measurements. The impact of substrate noise is modeled in a high Ohmic 0.18um 1P6M CMOS technology. Below 10MHz, the impact is dominated by the on-chip resistance of the VCO ground. Above 10MHz, the bond wires, parasitics of the on-chip inductor and the off-chip decoupling capacitors determine the sensitivity to substrate perturbations.",

keywords = "substrate noise, CMOS integrated circuit, voltage controlled oscillator, sensitivity, immunity",

author = "Stephane Bronckers and Gerd Vandersteen and Charlotte Soens and {Van Der Plas}, G. and Yves Rolain",

year = "2007",

month = may,

day = "1",

language = "English",

isbn = "1-4244-0589-0",

booktitle = "IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007",

note = "Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet ; Conference date: 21-09-2009 Through 25-09-2009",

}

Bronckers, S, Vandersteen, G, Soens, C, Van Der Plas, G & Rolain, Y 2007, Measurement and modeling of the sensitivity of LC-VCO’s to substrate noise perturbations. in IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007. Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet, Stockholm, Sweden, 21/09/09.

TY - GEN

T1 - Measurement and modeling of the sensitivity of LC-VCO’s to substrate noise perturbations

AU - Bronckers, Stephane

AU - Vandersteen, Gerd

AU - Soens, Charlotte

AU - Van Der Plas, G.

AU - Rolain, Yves

PY - 2007/5/1

Y1 - 2007/5/1

N2 - On-chip oscillators are very sensitive to substrate perturbations. Both low-frequency and high-frequency distortions can ruin the required spectral purity of the oscillator. This paper presents the measurement and modeling results of the sensitivity of a 900MHz LCVoltage Controlled Oscillator (LC-VCO) to substrate perturbations in a frequency range from DC to 900MHz. Accurate measurement of the sensitivity require various measurement setups to investigate different impact fenomena. These measurements implies spectral analysis, linear vectorial network analyzer measurements and time domain measurements. The impact of substrate noise is modeled in a high Ohmic 0.18um 1P6M CMOS technology. Below 10MHz, the impact is dominated by the on-chip resistance of the VCO ground. Above 10MHz, the bond wires, parasitics of the on-chip inductor and the off-chip decoupling capacitors determine the sensitivity to substrate perturbations.

AB - On-chip oscillators are very sensitive to substrate perturbations. Both low-frequency and high-frequency distortions can ruin the required spectral purity of the oscillator. This paper presents the measurement and modeling results of the sensitivity of a 900MHz LCVoltage Controlled Oscillator (LC-VCO) to substrate perturbations in a frequency range from DC to 900MHz. Accurate measurement of the sensitivity require various measurement setups to investigate different impact fenomena. These measurements implies spectral analysis, linear vectorial network analyzer measurements and time domain measurements. The impact of substrate noise is modeled in a high Ohmic 0.18um 1P6M CMOS technology. Below 10MHz, the impact is dominated by the on-chip resistance of the VCO ground. Above 10MHz, the bond wires, parasitics of the on-chip inductor and the off-chip decoupling capacitors determine the sensitivity to substrate perturbations.

KW - substrate noise

KW - CMOS integrated circuit

KW - voltage controlled oscillator

KW - sensitivity

KW - immunity

M3 - Conference paper

SN - 1-4244-0589-0

BT - IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007

T2 - Finds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet

Y2 - 21 September 2009 through 25 September 2009

ER -

Measurement and modeling of the sensitivity of LC-VCO’s to substrate noise perturbations

Abstract

Conference

Keywords

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Activities

IEEE/IMTC 2007, the IEEE Instrumentation and Measurement Technology Conference

IEEE/IMTC 2007, the IEEE Instrumentation and Measurement Technology Conference

IEEE/IMTC 2007, the IEEE Instrumentation and Measurement Technology Conference

Cite this