Measurement and modeling of the sensitivity of LC-VCO’s to substrate noise perturbations

Stephane Bronckers, Gerd Vandersteen, Charlotte Soens, G. Van Der Plas, Yves Rolain

Research output: Chapter in Book/Report/Conference proceedingConference paper

3 Citations (Scopus)

Abstract

On-chip oscillators are very sensitive to substrate perturbations.
Both low-frequency and high-frequency distortions can ruin
the required spectral purity of the oscillator. This paper presents the
measurement and modeling results of the sensitivity of a 900MHz LCVoltage
Controlled Oscillator (LC-VCO) to substrate perturbations
in a frequency range from DC to 900MHz. Accurate measurement of
the sensitivity require various measurement setups to investigate different
impact fenomena. These measurements implies spectral analysis,
linear vectorial network analyzer measurements and time domain
measurements. The impact of substrate noise is modeled in a high
Ohmic 0.18um 1P6M CMOS technology. Below 10MHz, the impact
is dominated by the on-chip resistance of the VCO ground. Above
10MHz, the bond wires, parasitics of the on-chip inductor and the
off-chip decoupling capacitors determine the sensitivity to substrate
perturbations.
Original languageEnglish
Title of host publicationIMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
Publication statusPublished - 1 May 2007
EventFinds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet - Stockholm, Sweden
Duration: 21 Sep 200925 Sep 2009

Conference

ConferenceFinds and Results from the Swedish Cyprus Expedition: A Gender Perspective at the Medelhavsmuseet
Country/TerritorySweden
CityStockholm
Period21/09/0925/09/09

Keywords

  • substrate noise
  • CMOS integrated circuit
  • voltage controlled oscillator
  • sensitivity
  • immunity

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