Measurement and modeling of the sensitivity of LC-VCO’s to substrate noise perturbations

Stephane Bronckers, Gerd Vandersteen, Charlotte Soens, G. Van Der Plas, Yves Rolain

Research output: Chapter in Book/Report/Conference proceedingConference paper

3 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Measurement and modeling of the sensitivity of LC-VCO’s to substrate noise perturbations'. Together they form a unique fingerprint.

Physics & Astronomy