Measuring In-Band Distortions of Mixers

Alain Geens, Wendy Van Moer, Yves Rolain

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

This paper proposes a method to measure the in-band deterministic and stochastic contributions of nonlinear distortions and mixers. The model of the mixer as a two- or three-port device is developed. Based on this model, the measurement technique—which is a generalization of the methods developed for amplifiers—is developed. While designing the measurement method, the difficulties that arise out of the fundamental differences between mixers (three-port devices) and amplifiers (two-port devices) are taken into account. Two techniques are presented, depending on the fact that the phase of the local oscillator is known or unknown.
Original languageEnglish
Pages (from-to)1030-1034
JournalIEEE Transactions on Instrumentation and Measurement
Volume52
Issue number4
Publication statusPublished - 1 Aug 2003

Bibliographical note

IEEE Transactions on Instrumentation and Measurement, Vol. 52, No. 4, August 2003, pp. 1030-1034

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