| Original language | English |
|---|---|
| Title of host publication | 53rd ARFTG Conference digest Anacheim California pp.89-97 |
| Publication status | Published - 18 Jun 1999 |
Measuring the characteristics of modulated non-linear devices
Yves Rolain, Wendy Van Moer, Philip Vael
Research output: Chapter in Book/Report/Conference proceeding › Conference paper
9
Citations
(Scopus)