Nonparametric Item Response Theory and Mokken Scale Analysis, with Relations to Latent Class Models and Cognitive Diagnostic Models

Andries Van Der Ark; Gina Rossi; Klaas Sijtsma

Nonparametric Item Response Theory and Mokken Scale Analysis, with Relations to Latent Class Models and Cognitive Diagnostic Models

Andries Van Der Ark, Gina Rossi, Klaas Sijtsma

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

2 Citations (Scopus)

Original language	English
Title of host publication	Handbook of Diagnostic Classification Models
Subtitle of host publication	Models and Model Extensions, Applications, Software Packages
Editors	Matthias von Davier, Young-Sun Lee
Publisher	Springer Nature Switzerland AG
Pages	21-45
ISBN (Electronic)	978-3-030-05584-4
ISBN (Print)	978-3-030-05583-7
Publication status	Published - 2019

Cite this

Van Der Ark, A., Rossi, G., & Sijtsma, K. (2019). Nonparametric Item Response Theory and Mokken Scale Analysis, with Relations to Latent Class Models and Cognitive Diagnostic Models. In M. von Davier, & Y-S. Lee (Eds.), Handbook of Diagnostic Classification Models: Models and Model Extensions, Applications, Software Packages (pp. 21-45). Springer Nature Switzerland AG.

Van Der Ark, Andries ; Rossi, Gina ; Sijtsma, Klaas. / Nonparametric Item Response Theory and Mokken Scale Analysis, with Relations to Latent Class Models and Cognitive Diagnostic Models. Handbook of Diagnostic Classification Models: Models and Model Extensions, Applications, Software Packages . editor / Matthias von Davier ; Young-Sun Lee. Springer Nature Switzerland AG, 2019. pp. 21-45

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year = "2019",

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Nonparametric Item Response Theory and Mokken Scale Analysis, with Relations to Latent Class Models and Cognitive Diagnostic Models. / Van Der Ark, Andries; Rossi, Gina; Sijtsma, Klaas.

Handbook of Diagnostic Classification Models: Models and Model Extensions, Applications, Software Packages . ed. / Matthias von Davier; Young-Sun Lee. Springer Nature Switzerland AG, 2019. p. 21-45.

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

TY - CHAP

T1 - Nonparametric Item Response Theory and Mokken Scale Analysis, with Relations to Latent Class Models and Cognitive Diagnostic Models

AU - Van Der Ark, Andries

AU - Rossi, Gina

AU - Sijtsma, Klaas

PY - 2019

Y1 - 2019

M3 - Chapter

SN - 978-3-030-05583-7

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EP - 45

BT - Handbook of Diagnostic Classification Models

A2 - von Davier, Matthias

A2 - Lee, Young-Sun

PB - Springer Nature Switzerland AG

ER -