On the Design ofOptimal Test Signals in the Case of Time Limited Excitations

Patrick Boets, Luc Peirlinckx, Patrick Guillaume, Leo Van Biesen

Research output: Chapter in Book/Report/Conference proceedingConference paper

Original languageEnglish
Title of host publicationProceedings of the IEEE Instrumentation and Measurement Technology Conference, Waltham (Massachusetts), April 24-26, pp. 717-722, 1995
PublisherProceedings of the IEEE Instrumentation and Measurement Technology Conference, Waltham (Massachusetts), April 24-26, pp. 717-722, 1995
Publication statusPublished - 1995
EventUnknown -
Duration: 1 Jan 1995 → …

Conference

ConferenceUnknown
Period1/01/95 → …

Bibliographical note

Proceedings of the
IEEE Instrumentation and Measurement Technology Conference, Waltham
(Massachusetts), April 24-26, pp. 717-722, 1995

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