Parametric Identification of Two-PortModels in the Frequency Domain

Patrick Guillaume; Rik Pintelon; Joannes Schoukens

Parametric Identification of Two-PortModels in the Frequency Domain

Patrick Guillaume, Rik Pintelon, Joannes Schoukens

Vrije Universiteit Brussel

Research output: Chapter in Book/Report/Conference proceeding › Annotation

Original language	English
Title of host publication	Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991
Publisher	Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991
Publication status	Published - 1991
Event	Unknown - Duration: 1 Jan 1991 → …

Conference

Conference	Unknown
Period	1/01/91 → …

Bibliographical note

Proceedings of the IEEE Instrumentation and
Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991

Access to Document

http://www.avrg.vub.ac.be

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Cite this

Guillaume, P., Pintelon, R., & Schoukens, J. (1991). Parametric Identification of Two-PortModels in the Frequency Domain. In Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991 Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991. http://www.avrg.vub.ac.be

Guillaume, Patrick ; Pintelon, Rik ; Schoukens, Joannes. / Parametric Identification of Two-PortModels in the Frequency Domain. Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991. Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991, 1991.

@inbook{8787008c932f411eb1b18179415d51f4,

title = "Parametric Identification of Two-PortModels in the Frequency Domain",

author = "Patrick Guillaume and Rik Pintelon and Joannes Schoukens",

note = "Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991; Unknown ; Conference date: 01-01-1991",

year = "1991",

language = "English",

booktitle = "Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991",

publisher = "Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991",

}

Guillaume, P, Pintelon, R & Schoukens, J 1991, Parametric Identification of Two-PortModels in the Frequency Domain. in Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991. Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991, Unknown, 1/01/91. <http://www.avrg.vub.ac.be>

Parametric Identification of Two-PortModels in the Frequency Domain. / Guillaume, Patrick; Pintelon, Rik; Schoukens, Joannes.
Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991. Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991, 1991.

Research output: Chapter in Book/Report/Conference proceeding › Annotation

TY - CHAP

T1 - Parametric Identification of Two-PortModels in the Frequency Domain

AU - Guillaume, Patrick

AU - Pintelon, Rik

AU - Schoukens, Joannes

N1 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991

PY - 1991

Y1 - 1991

M3 - Annotation

BT - Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991

PB - Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Atlanta (USA), May 14-16, pp. 263-271, 1991

T2 - Unknown

Y2 - 1 January 1991

ER -