Performance degradation of RF circuits due to impact of digital switching noise

Charlotte Soens, G. Van Der Plas, Piet Wambacq, S. Donnay, Maarten Kuijk, Alain Barel

Research output: Chapter in Book/Report/Conference proceedingMeeting abstract (Book)Research

Original languageEnglish
Title of host publicationURSI-forum 2004, Broadband Communications, Brussels, December 10, 2004
Publication statusPublished - 10 Dec 2004

Bibliographical note

URSI-forum 2004, Broadband Communications, Brussels, December 10, 2004

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