Performance studies of the CE-65v2 MAPS prototype structure

Eduardo Plörer, Alessandra Lorenzetti, Armin Ilg, Hitoshi Baba, Jerome Baudot, Auguste Besson, Szymon Bugiel, Tatsuya Chujo, Claude Colledani, Andrei Dorokhov, Ziad El Bitar, Mathieu Goffe, Taku Gunji, Christine Hu-Guo, Kimmo Jaaskelainen, Towa Katsuno, Alexander Kluge, Anhelina Kostina, Ajit Kumar, Anna MacchioloMagnus Mager, Jonghan Park, Shingo Sakai, Serhiy Senyukov, Hasan Shamas, Daito Shibata, Walter Snoeys, Pavel Stanek, Miljenko Šuljić, Lukas Tomasek, Isabelle Valin, Reita Wada, Yorito Yamaguchi

Research output: Contribution to journalArticlepeer-review

Abstract

With the next upgrade of the ALICE inner tracking system (ITS3) as its primary focus, a set of small MAPS test structures have been developed in the 65 nm TPSCo CMOS process. The CE-65 focuses on the characterisation of the analogue charge collection properties of this technology. The latest iteration, the CE-65v2, was produced in different processes (Standard, with a low-dose n-type blanket, and blanket with gap between pixels), pixel pitches (15, 18, 22.5 µm) and pixel arrangements (square or staggered). The comparatively large pixel array size of 48×24 pixels in CE-65v2 allows the uniformity of the pixel response to be studied, among other benefits. The CE-65v2 chip was characterised in a test beam at the CERN SPS. A first analysis showed that hit efficiencies of ≥ 99% and spatial resolution better than 5 µm can be achieved for all pitches and process variants. For the Standard process, thanks to larger charge sharing, even spatial resolutions below 3 µm are reached, in line with vertex detector requirements for the FCC-ee. This contribution further investigates the data collected at the SPS test beam. Thanks to the large sensor size and efficient data collection, a large amount of statistics was collected, which allows for detailed in-pixel studies to see the efficiency and spatial resolution as a function of the hit position within the pixels. Again, different pitches and process variants are compared.
Original languageEnglish
Article numberC03033
Number of pages7
JournalJournal of Instrumentation
Volume20
Issue number3
DOIs
Publication statusPublished - 1 Mar 2025

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