STEM Education in Flanders: How STEM@school Aims to Foster STEM Literacy and a Positive Attitude towards STEM

Heidi Knipprath; Lieve Thibaut; Marie-Paule Buyse; Stijn Ceuppens; Haydee De Loof; Jolien De Meester; Leen Goovaerts; Annemie Struyf; Jelle Boeve-De Pauw; Fien Depaepe; Johan Deprez; Mieke De Cock; Luc Hellinckx; Greet Langie; Katrien Struyven; Didier Van de Velde; Peter Van Petegem; Wim Dehaene

STEM Education in Flanders: How STEM@school Aims to Foster STEM Literacy and a Positive Attitude towards STEM

Heidi Knipprath, Lieve Thibaut, Marie-Paule Buyse, Stijn Ceuppens, Haydee De Loof, Jolien De Meester, Leen Goovaerts, Annemie Struyf, Jelle Boeve-De Pauw, Fien Depaepe, Johan Deprez, Mieke De Cock, Luc Hellinckx, Greet Langie, Katrien Struyven, Didier Van de Velde, Peter Van Petegem, Wim Dehaene

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	36-40
Number of pages	5
Journal	IEEE Instrumentation & Measurement Magazine
Volume	21
Issue number	3
Publication status	Published - Jun 2018

Handle.net

Persistent link

Cite this

Knipprath, H., Thibaut, L., Buyse, M.-P., Ceuppens, S., De Loof, H., De Meester, J., Goovaerts, L., Struyf, A., Boeve-De Pauw, J., Depaepe, F., Deprez, J., De Cock, M., Hellinckx, L., Langie, G., Struyven, K., Van de Velde, D., Van Petegem, P., & Dehaene, W. (2018). STEM Education in Flanders: How STEM@school Aims to Foster STEM Literacy and a Positive Attitude towards STEM. IEEE Instrumentation & Measurement Magazine, 21(3), 36-40.

@article{62493994130f4a23b3ff7803ef8523be,

title = "STEM Education in Flanders: How STEM@school Aims to Foster STEM Literacy and a Positive Attitude towards STEM",

author = "Heidi Knipprath and Lieve Thibaut and Marie-Paule Buyse and Stijn Ceuppens and {De Loof}, Haydee and {De Meester}, Jolien and Leen Goovaerts and Annemie Struyf and {Boeve-De Pauw}, Jelle and Fien Depaepe and Johan Deprez and {De Cock}, Mieke and Luc Hellinckx and Greet Langie and Katrien Struyven and {Van de Velde}, Didier and {Van Petegem}, Peter and Wim Dehaene",

year = "2018",

month = jun,

language = "English",

volume = "21",

pages = "36--40",

journal = "IEEE Instrumentation & Measurement Magazine",

issn = "1094-6969",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "3",

}

Knipprath, H, Thibaut, L, Buyse, M-P, Ceuppens, S, De Loof, H, De Meester, J, Goovaerts, L, Struyf, A, Boeve-De Pauw, J, Depaepe, F, Deprez, J, De Cock, M, Hellinckx, L, Langie, G, Struyven, K, Van de Velde, D, Van Petegem, P & Dehaene, W 2018, 'STEM Education in Flanders: How STEM@school Aims to Foster STEM Literacy and a Positive Attitude towards STEM', IEEE Instrumentation & Measurement Magazine, vol. 21, no. 3, pp. 36-40.

TY - JOUR

T1 - STEM Education in Flanders: How STEM@school Aims to Foster STEM Literacy and a Positive Attitude towards STEM

AU - Knipprath, Heidi

AU - Thibaut, Lieve

AU - Buyse, Marie-Paule

AU - Ceuppens, Stijn

AU - De Loof, Haydee

AU - De Meester, Jolien

AU - Goovaerts, Leen

AU - Struyf, Annemie

AU - Boeve-De Pauw, Jelle

AU - Depaepe, Fien

AU - Deprez, Johan

AU - De Cock, Mieke

AU - Hellinckx, Luc

AU - Langie, Greet

AU - Struyven, Katrien

AU - Van de Velde, Didier

AU - Van Petegem, Peter

AU - Dehaene, Wim

PY - 2018/6

Y1 - 2018/6

M3 - Article

SN - 1094-6969

VL - 21

SP - 36

EP - 40

JO - IEEE Instrumentation & Measurement Magazine

JF - IEEE Instrumentation & Measurement Magazine

IS - 3

ER -