The use of spetroscopic ellipsometry for the characterisation of conversion coatings on aluminium

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Extended Abstracts 2nd International Symposium on Aluminium Surface Science and Technology, 21-25.05.2000, Manchester, England, 129

Cite this

@article{621a72feb6bb4bd4b2eafb1b06249728,

title = "The use of spetroscopic ellipsometry for the characterisation of conversion coatings on aluminium",

author = "Tom SCHRAM and Priya Laha",

note = "Extended Abstracts 2nd International Symposium on Aluminium Surface Science and Technology, 21-25.05.2000, Manchester, England, 129",

year = "2000",

language = "English",

journal = "Unknown Journal",

}