Through-thickness analysis of the skin layer thickness of multi-layered biaxially-oriented polypropylene films by micro-thermal analysis

Guy Van Assche, Antoine Ghanem, Olivier Lhost, Bruno Van Mele

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

A novel method is presented for the determination of the thickness of a polymer layer on a solid substrate by through-thickness local
thermal analysis (LTA) measurements using a micro-thermal analyser (mTA). The feasibility of the method is illustrated for a poly(methyl
methacrylate) film spin-cast on a silicon wafer. Subsequently the method is applied to determine the skin layer thickness of multi-layered biaxially-oriented polypropylene (BOPP) films. Although the melting temperatures of skin and core layer are only 15 8C different, it proved
to be possible to determine the skin layer thickness. The film thickness obtained by mTA correlates well with the thickness observed by
transmission electron microscopy (TEM) in a 0.1–1.6 mm range. The method is shown to be accurate, robust, and fast.
Original languageEnglish
Pages (from-to)7132-7139
Number of pages8
JournalPolymer
Volume46
Publication statusPublished - 2005

Bibliographical note

Polymer 46(18) (2005) 7132-7139.

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