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Time-domain variability analysis of large circuits with stochastic linear terminations

Y. Tao, K. Guo, F. Ferranti, B. Nouri, M. Nakhla, R. Achar

Research output: Chapter in Book/Report/Conference proceedingConference paper

2 Citations (Scopus)

Abstract

An non-intrusive technique is proposed for time-domain variability analysis of large circuits with multiple stochastic parameters and stochastic terminations. A stochastic collocation technique is used in combination with a moment matching parameterized model order reduction approach and numerical inversion of Laplace transform. Pertinent numerical results validate the proposed method.

Original languageEnglish
Title of host publication2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings
PublisherIEEE
ISBN (Electronic)9781509056163
DOIs
Publication statusPublished - 7 Jun 2017
Event21st IEEE Workshop on Signal and Power Integrity, SPI 2017 - Lake Maggiore (Baveno), Italy
Duration: 7 May 201710 May 2017

Publication series

Name2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings

Conference

Conference21st IEEE Workshop on Signal and Power Integrity, SPI 2017
Country/TerritoryItaly
CityLake Maggiore (Baveno)
Period7/05/1710/05/17

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