Towards a reliable characterisation of oxide layers on pure aluminium using high energy resolution FE-AES Surface and Interface Analysis

Isabelle Vandendael; Tom Hauffman; Yves Van Ingelgem; Annick Hubin; Herman Terryn

Towards a reliable characterisation of oxide layers on pure aluminium using high energy resolution FE-AES Surface and Interface Analysis

Isabelle Vandendael, Tom Hauffman, Yves Van Ingelgem, Annick Hubin, Herman Terryn

Materials and Chemistry

Research output: Contribution to journal › Article › peer-review

Abstract

xx

Original language	English
Pages (from-to)	897-901
Number of pages	5
Journal	Surface and Interface Analysis
Volume	42
Publication status	Published - 2010

Keywords

FE-AES
aluminium

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@article{4f4215ba44884e3d805e15bb80834f89,

title = "Towards a reliable characterisation of oxide layers on pure aluminium using high energy resolution FE-AES Surface and Interface Analysis",

abstract = "xx",

keywords = "FE-AES, aluminium",

author = "Isabelle Vandendael and Tom Hauffman and {Van Ingelgem}, Yves and Annick Hubin and Herman Terryn",

year = "2010",

language = "English",

volume = "42",

pages = "897--901",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "John Wiley and Sons Ltd",

}

TY - JOUR

T1 - Towards a reliable characterisation of oxide layers on pure aluminium using high energy resolution FE-AES Surface and Interface Analysis

AU - Vandendael, Isabelle

AU - Hauffman, Tom

AU - Van Ingelgem, Yves

AU - Hubin, Annick

AU - Terryn, Herman

PY - 2010

Y1 - 2010

N2 - xx

AB - xx

KW - FE-AES

KW - aluminium

M3 - Article

SN - 0142-2421

VL - 42

SP - 897

EP - 901

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

ER -

Towards a reliable characterisation of oxide layers on pure aluminium using high energy resolution FE-AES Surface and Interface Analysis

Abstract

Keywords

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