Use of spectro-scopic ellipsometry to study Zr/Ti films on Al

Research output: Contribution to journalArticlepeer-review

43 Citations (Scopus)
Original languageEnglish
Pages (from-to)677 - 680
JournalSurface and Interface Analysis
Volume34
Issue number1
Publication statusPublished - 2002

Bibliographical note

Surface and Interface Analysis, 34 (2002) 677-680

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