Use of spectro-scopic ellipsometry to study Zr/Ti films on Al

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47 Citations (Scopus)

Original language	English
Pages (from-to)	677 - 680
Journal	Surface and Interface Analysis
Volume	34
Issue number	1
Publication status	Published - 2002

Surface and Interface Analysis, 34 (2002) 677-680

Cite this

@article{d93358458db348eea8b2dded9cf7f37f,

title = "Use of spectro-scopic ellipsometry to study Zr/Ti films on Al",

author = "Priya Laha and Tom SCHRAM and Herman Terryn",

note = "Surface and Interface Analysis, 34 (2002) 677-680",

year = "2002",

language = "English",

volume = "34",

pages = "677 -- 680",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "John Wiley and Sons Ltd",

number = "1",

}