Abstract
This thesis introduces Sparse-Lattice Structured Illumination Microscopy (SL-SIM), a novel technique designed to expand the field of view without sacrificing resolution. It reformulates SIM theory using Fourier optics and sparse lattice illumination. A mathematical model simulates ideal image reconstruction and reveals axial artifacts. Two reconstruction strategies are explored: rigid pattern shifts and pairwise beam illumination.The first suffers from numerical instability; the second offers better conditioning. A proposed experimental setup integrates SL-SIM into a practical optical system. Theoretical and computational groundwork is laid for future SL-SIM development. SL-SIM shows promise for high-throughput, high-resolution microscopy.
| Date of Award | 27 Jun 2025 |
|---|---|
| Original language | English |
| Supervisor | Niels Verellen (Co-promotor) & Victor Chuman (Advisor) |
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