Quantitative electron microscopy X-ray analysis (SEM-EDX) using Monte Carlo simiulation and partial least square regression.

  • Jia Zhu ((PhD) Student)
  • L. Van Espen (Promotor)
  • L. Van Vaeck (Jury)
  • Johanna Verbeke (Jury)
  • P. Lemberghe (Jury)
  • F. Adams (Jury)
  • A. Bogaerts (Jury)

Student thesis: Doctoral Thesis

Date of Award2005
Original languageEnglish
SupervisorJohanna Verbeke (Jury), L. Van Espen (Promotor), L. Van Vaeck (Jury), P. Lemberghe (Jury), F. Adams (Jury) & A. Bogaerts (Jury)

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