ToF-SIMS characterization of the interfacial molecular chemistry in metal (active) corrosion protection systems based on organic coatings

Abstract

This work presents a data analysis extension to a well-established methodology for the assessment of organic coatings using imaging time-of-flight secondary ion mass spectrometry (ToF-SIMS). Such an approach produced results that can be analyzed using a multivariate analysis (MVA) procedure that performs the simultaneous processing of spatially and chemically related datasets.

Date of Award	31 Jan 2020
Original language	English
Awarding Institution	Vrije Universiteit Brussel
Supervisor	Tom Hauffman (Promotor), Herman Terryn (Promotor), Guy Van Assche (Jury), Vanina Cristaudo (Jury), John F. Watts (Jury), Mélanie Gauvin (Jury), Stefan De Gendt (Jury) & Rik Pintelon (Jury)