Projecten per jaar
Persoonlijk profiel
Opleiding / Academische kwalificatie
electrical engineering, Ph.D
Externe posities
principal member of the technical staff, Interuniversitair Micro-Elektronica Centrum
1 jan 2005 → …
Vingerafdruk
- 1 Soortgelijke profielen
Samenwerkingen en hoofdonderzoeksgebieden uit de afgelopen vijf jaar
Projecten
- 2 Actief
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IOFACC12: Tech4Health: Venturing in het domein van de gezondheidstechnologieën van de toekomst.
Stiens, J., Wambacq, P., da Silva Gomes, B. T., Sahli, H., Vandemeulebroucke, J., Jansen, B., Lemeire, J., Steenhaut, K., Munteanu, A., Deligiannis, N., Schelkens, P., Kuijk, M., Parvais, B., Chan, C. W., Van Schependom, J., Touhafi, A., Braeken, A., Runacres, M., Cornelis, B., Schretter, C., Blinder, D., Temmermans, F. & Islamaj, E.
1/01/24 → 30/06/25
Project: Toegepast
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IOF3016: GEAR: Zich wagen aan toekomstige gezondheidstechnologieën
Stiens, J., Wambacq, P., da Silva Gomes, B. T., Sahli, H., Vandemeulebroucke, J., Jansen, B., Lemeire, J., Steenhaut, K., Munteanu, A., Deligiannis, N., Schelkens, P., Kuijk, M., Parvais, B., Chan, C. W., Van Schependom, J., Touhafi, A., Braeken, A., Runacres, M., Cornelis, B., Schretter, C., Blinder, D., Temmermans, F., Thielemans, S., Papavasileiou, E., Brahimetaj, R., De Canck, H. & Ersu, B.
1/01/21 → 24/12/25
Project: Toegepast
Onderzoeksoutput
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A CMOS compatible III-v-on-300 mm SI technology for future high-speed communication systems: Challenges and possibilities
Vais, A., Kumar, A., Boccardi, G., Yadav, S., Mols, Y., Alcotte, R., Vermeersch, B., Ingels, M., Peralagu, U., Roda Neve, C., Ghyselen, B., Parvais, B., Wambacq, P., Kunert, B. & Collaert, N., 22 aug 2024, Key Enabling Technologies for Future Wireless, Wired, Optical and Satcom Applications. River Publishers, blz. 27-40 14 blz.Onderzoeksoutput: Chapter › peer review
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AlN/Si interface engineering to mitigate RF losses in MOCVD grown GaN-on-Si substrates
Cardinael, P., Yadav, S., Hahn, H., Zhao, M., Banerjee, S., Esfeh, B. K., Mauder, C., Sullivan, B. O., Peralagu, U., Vohra, A., Langer, R., Collaert, N., Parvais, B. & Raskin, J-P., 3 apr 2024.Onderzoeksoutput: Voordruk › peer review
Bestand7 Downloads (Pure) -
An Adaptable In(Ga)P/Ga(Sb)As/Ga(In)As HBT Technology on 300 mm Si for RF Applications
Kumar, A., Yadav, S., Vais, A., Boccardi, G., Mols, Y., Alcotte, R., Parvais, B., Kunert, B. & Collaert, N., 2024, 2024 IEEE/MTT-S International Microwave Symposium, IMS 2024. Institute of Electrical and Electronics Engineers Inc., blz. 940-943 4 blz. (IEEE MTT-S International Microwave Symposium Digest).Onderzoeksoutput: Conference paper
1 Citaat (Scopus) -
Charge Trapping and Emission during Bias Temperature Stressing of Schottky Gate GaN-on-Silicon HEMT Structures Targeting RF/mm Wave Power Amplifiers
O'Sullivan, B., Rathi, A., Alian, A., Yadav, S., Yu, H., Sibaja-Hernandez, A., Peralagu, U., Parvais, B., Chasin, A. & Collaert, N., 24 jul 2024, In: Micromachines. 15, 8, 13 blz., 951.Onderzoeksoutput: Article › peer review
Open Access -
DC Reliability Study of high-? GaN-on-Si MOS-HEMT's for mm-Wave Power Amplifiers
O'Sullivan, B. J., Alian, A., Sibaja-Hernandez, A., Franco, J., Yadav, S., Yu, H., Rathi, A., Peralagu, U., Chasin, A., Parvais, B. & Collaert, N., 2024, 2024 IEEE International Reliability Physics Symposium, IRPS 2024 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 9 blz. (IEEE International Reliability Physics Symposium Proceedings).Onderzoeksoutput: Conference paper