!!Projects per year
Persoonlijk profiel
Opleiding / Academische kwalificatie
electrical engineering, Ph.D
Externe posities
principal member of the technical staff, Interuniversitair Micro-Elektronica Centrum
1 jan. 2005 → …
Vingerafdruk
- 1 Soortgelijke profielen
Samenwerkingen en hoofdonderzoeksgebieden uit de afgelopen vijf jaar
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FWOSB200: Faalmechanismen van GaN-op-Si-apparaat bij hoogfrequente RF-operatie
Gupta, A. (Mandataris) & Parvais, B. (Administrative Promotor)
1/11/25 → 31/10/29
Project: Fundamenteel
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IOF3016: GEAR: Zich wagen aan toekomstige gezondheidstechnologieën
Stiens, J. (Administrative Promotor), Wambacq, P. (Medewerker), da Silva Gomes, B. T. (Medewerker), Sahli, H. (Medewerker), Vandemeulebroucke, J. (Medewerker), Jansen, B. (Medewerker), Lemeire, J. (Medewerker), Steenhaut, K. (Medewerker), Munteanu, A. (Medewerker), Deligiannis, N. (Medewerker), Schelkens, P. (Medewerker), Kuijk, M. (Medewerker), Parvais, B. (Medewerker), Chan, C. W. (Medewerker), Van Schependom, J. (Medewerker), Touhafi, A. (Medewerker), Braeken, A. (Medewerker), Runacres, M. (Medewerker), Cornelis, B. (Medewerker), Schretter, C. (Medewerker), Blinder, D. (Medewerker), Temmermans, F. (Medewerker), Thielemans, S. (Mandataris), Papavasileiou, E. (Mandataris), Brahimetaj, R. (Mandataris), De Canck, H. (Mandataris) & Ersu, B. (Mandataris)
1/01/21 → 30/09/26
Project: Toegepast
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IOFACC12: Tech4Health: Venturing in het domein van de gezondheidstechnologieën van de toekomst.
Stiens, J. (Administrative Promotor), Wambacq, P. (CoI (Co-Promotor)), da Silva Gomes, B. T. (CoI (Co-Promotor)), Sahli, H. (CoI (Co-Promotor)), Vandemeulebroucke, J. (CoI (Co-Promotor)), Jansen, B. (CoI (Co-Promotor)), Lemeire, J. (CoI (Co-Promotor)), Steenhaut, K. (CoI (Co-Promotor)), Munteanu, A. (CoI (Co-Promotor)), Deligiannis, N. (CoI (Co-Promotor)), Schelkens, P. (CoI (Co-Promotor)), Kuijk, M. (CoI (Co-Promotor)), Parvais, B. (CoI (Co-Promotor)), Chan, C. W. (CoI (Co-Promotor)), Van Schependom, J. (CoI (Co-Promotor)), Touhafi, A. (CoI (Co-Promotor)), Braeken, A. (CoI (Co-Promotor)), Runacres, M. (CoI (Co-Promotor)), Cornelis, B. (CoI (Co-Promotor)), Schretter, C. (CoI (Co-Promotor)), Blinder, D. (CoI (Co-Promotor)), Temmermans, F. (CoI (Co-Promotor)) & Islamaj, E. (Mandataris)
1/01/24 → 30/06/25
Project: Toegepast
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Dynamic ON-State Breakdown of GaN-on-Si HEMT
Yu, H., Gupta, A., Kuo, Y.-C., Chong, Y., Wu, T.-L., Yadav, S., ElKashlan, R., Banerjee, S., Hahn, H., Mauder, C., Rathi, A., Wu, W.-M., Esfeh, B. K., Bury, E., Vermeersch, B., O'Sullivan, B., Alian, A., Asad, M., Peralagu, U. & Parvais, B. & 1 anderen, , 22 mrt. 2026, 2026 IEEE International Reliability Physics Symposium (IRPS). 2026 uitgave Tucson, USA: IEEE International Reliability Physics Symposium (IRPS), blz. 1-8 8 blz. (IEEE International Reliability Physics Symposium proceedings ).Onderzoeksoutput: Conference paper
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Understanding Gate Breakdown Mechanisms in RF GaN MIS-HEMTs with thin gate SiN
Navolotskaia, A., Yu, H., Kuo, Y. C., Yang, Y., Huang, C. Y., Lin, W. T., Chong, Y., Osullivan, B., Rathi, A., Gupta, A., Alian, A., Peralagu, U., Parvais, B., Collaert, N. & Wu, T. L., 2026, 2026 IEEE International Reliability Physics Symposium, IRPS 2026. Institute of Electrical and Electronics Engineers Inc., blz. 1-6 6 blz. (IEEE International Reliability Physics Symposium Proceedings).Onderzoeksoutput: Conference paper
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Analysis of the Gate Current’s Influence on the RF Power Performance of InAlN/GaN HEMTs
Xiao, D., Schreurs, D. M.M.-P., ElKashlan, R., Zhang, Y., Cooman, A., Khaled, A., Smellie, D., Alian, A., Asad, M., Parvais, B., Wambacq, P., Peralagu, U. & Collaert, N., feb. 2025, In: IEEE Transactions on Microwave Theory and Techniques. 73, 2, blz. 779-788 10 blz.Onderzoeksoutput: Article › peer review
Open AccessBestand5 Citaten (Scopus)2 Downloads (Pure) -
Comparative cradle-to-gate LCA of RF power amplifiers for user equipment
Vanhouche, B., Vais, A., Boakes, L., Soethoudt, J., Alian, A., Ragnarsson, L.-Å., Rolin, C. & Parvais, B., 20 nov. 2025, In: Nanotechnology. 36, 47, 16 blz.Onderzoeksoutput: Article › peer review
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Impact of Gate to Drain Underlap on MISHEMT S-Parameters
Canales, B., Sanches, B. C., Martino, J. A., Peralagu, U., Parvais, B., Collaert, N. & Agopian, P., 11 jul. 2025, In: ECS Meeting Abstracts. 1 blz., 1716.Onderzoeksoutput: Article › peer review
Open Access
Activiteiten
- 1 Written proposal
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Failure Mechanisms of GaN-on-Si Device in High-Frequency RF Operation
Gupta, A. (Contributor) & Parvais, B. (Advisor)
3 mrt. 2025Activiteit: Written proposal