Accurate On Wafer Measurement of Phase and Amplitude of the Spectral Components of Incident and Scattered Voltage Waves at the Signal Pors of a Nonlinear Microwave Device

Jan Verspecht, Peter Debie, Alain Barel, Luc Martens

Onderzoeksoutput: Conference paper

Originele taal-2English
TitelProceedings IEEE MTT-S, 1995, pp. 1029-1032
StatusPublished - 1995
EvenementUnknown -
Duur: 1 jan 1995 → …


Periode1/01/95 → …

Bibliografische nota

Proceedings IEEE MTT-S, 1995, pp. 1029-1032

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