Accurate On Wafer Measurements Of The Large-Signal Behavior Of A Nonlinear MicroWave Device

Jan Verspecht, Peter Debie, Alain Barel, Luc Martens

Onderzoeksoutput: Articlepeer review

1 Citaat (Scopus)
Originele taal-2English
TijdschriftUnknown Journal
StatusPublished - 1 feb 1996

Bibliografische nota

Revue HF, No. 2, 1996, pp. 35–45

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