Advanced XPS analysis of Cr(VI)-free anodic oxide surface chemistry and its effect on oxide-resin bonding

Shoshan Abrahami, Tom Hauffman, John M. M. de Kok, Herman Terryn, Johannes M. C. Mol

Onderzoeksoutput: Unpublished abstract

Originele taal-2English
StatusPublished - 2015
Evenement16th European Conference on Applications of Surface and Interface Analysis - Granada, Spain
Duur: 28 sep 20151 okt 2015

Conference

Conference16th European Conference on Applications of Surface and Interface Analysis
Land/RegioSpain
Periode28/09/151/10/15

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