Analysis of errors associated with photometric distance in goniophotometry

Valéry Ann Jacobs, Peter Blattner, Yoshi Ohno, Udo Krueger, Peter Hanselaer, Patrick Rombauts, Frank Schmidt

Onderzoeksoutput: Conference paper

Originele taal-2English
Titel28th CIE SESSION
UitgeverijCIE Central Bureau Vienna-A
Pagina's458
Aantal pagina's461
Volume1
ISBN van geprinte versie9783902842558
StatusPublished - 1 jul 2015
Evenement28th Session of the CIE - Manchester, United Kingdom
Duur: 28 jun 20154 jul 2015

Publicatie series

NaamProceedings of the 28th Session of the CIE, Manchester
Volume1

Conference

Conference28th Session of the CIE
Land/RegioUnited Kingdom
StadManchester
Periode28/06/154/07/15

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