Analysis of Gate-Metal Resistance in CMOS-Compatible RF GaN HEMTs

R. Y. ElKashlan, R. Rodriguez, S. Yadav, A. Khaled, U. Peralagu, A. Alian, N. Waldron, M. Zhao, P. Wambacq, B. Parvais, N. Collaert

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Samenvatting

To enable CMOS-compatible GaN HEMTs for the next generation of communication systems (5G and beyond), a low gate resistance is of great importance since it directly affects the RF power gain and fMAX of the transistor. In this article, the impact of various gate-metal stacks on the gate resistance and RF performance of the devices is studied. The optimized Ti-free gate-metal process leads to fMAX enhancement up to ~50% for devices scaled down to 0.32-μm gate lengths. The gate resistance for the T-shaped gate is modeled from the S-parameters and validated on various gate field plate geometries. The tradeoff between the gate resistance and the parasitic capacitance in GaN HEMTs is highlighted in this case.
Originele taal-2English
Artikelnummer9186848
Pagina's (van-tot)4592-4596
Aantal pagina's5
TijdschriftIEEE Transactions on Electron Devices
Volume67
Nummer van het tijdschrift11
DOI's
StatusPublished - nov 2020

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