TY - GEN
T1 - Assessing the Impact of EV Charging and Discharging Profiles on T-Type Active Front End Charger Lifetime
AU - Polat, Hakan
AU - Hosseinabadi, Farzad
AU - Chakraborty, Sajib
AU - Geury, Thomas
AU - El Baghdadi, Mohamed
AU - Hegazy, Omar
N1 - Funding Information:
This work was supported by HiEFFICIENT project. This project has received funding from the ECSEL Joint Undertaking (JU) under grant agreement no. 101007281. The JU receives support from the European Union s Horizon 2020 research and innovation programme and Austria, Germany, Slovenia, Netherlands, Belgium, Slovakia, France, Italy, and Turkey.
Funding Information:
Acknowledgments: This work was supported by HiEFFICIENT project. This project has received funding from the ECSEL Joint Undertaking (JU) under grant agreement no. 101007281. The JU receives support from the European Union’s Horizon 2020 research and innovation programme and Austria, Germany, Slovenia, Netherlands, Belgium, Slovakia, France, Italy, and Turkey.
Publisher Copyright:
© 2023 IEEE.
PY - 2023/11/16
Y1 - 2023/11/16
N2 - This paper aims to assess the lifetime of a T-type active front end (AFE) converter in the context of Grid-to-Vehicle (G2V) and Vehicle-to-Grid (V2G) applications providing various grid services. To achieve this goal, the research paper presents two G2V and three V2G profiles and measures the junction temperature oscillationsfor the entire mission profile. Then, the temperature profiles are imported into a reliability assessment model to determine each mission profile’s impact on the system’s reliability
AB - This paper aims to assess the lifetime of a T-type active front end (AFE) converter in the context of Grid-to-Vehicle (G2V) and Vehicle-to-Grid (V2G) applications providing various grid services. To achieve this goal, the research paper presents two G2V and three V2G profiles and measures the junction temperature oscillationsfor the entire mission profile. Then, the temperature profiles are imported into a reliability assessment model to determine each mission profile’s impact on the system’s reliability
UR - http://www.scopus.com/inward/record.url?scp=85179520479&partnerID=8YFLogxK
U2 - 10.1109/IECON51785.2023.10312263
DO - 10.1109/IECON51785.2023.10312263
M3 - Conference paper
SN - 979-8-3503-3183-7
T3 - IECON Proceedings (Industrial Electronics Conference)
SP - 1
EP - 7
BT - IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society
PB - IEEE
CY - Singapore
ER -