Characterization of Substrate Noise Impact on RF CMOS Integrated Circuits in Lightly Doped Substrates

Charlotte Soens, C. Crunelle, P. Wambacq, Gerd Vandersteen, S. Donnay, Yves Rolain, Maarten Kuijk, Alain Barel

Onderzoeksoutput: Conference paper

10 Citaten (Scopus)

Samenvatting

Analog and RF circuit performance in single-chip transceivers can severely suffer from coupling of digital switching noise to the silicon substrate To predict this performance degradation, a deeper understanding of the impact of substrate noise is absolutely necessary. Using measurements, this impact is studied as the cascade of an attenuation through the substrate from the source of substrate noise to the RF circuit and the propagation through the RF circuit to its output This approach has been validated with measurements on a 0.25 mum and a 0.18 mum CMOS low-noise. amplifier (LNA) and reveals insight in the mechanisms of impact of substrate noise on RF circuits. In addition, impact of a real digital circuit is measured on a 0.18 mum differential CMOS LNA
Originele taal-2English
Titel20th IEEE Instrumentation and Measurement Technology Conference
UitgeverijIEEE, 345 E 47TH ST, NEW YORK
Pagina's1303-1308
Aantal pagina's6
ISBN van geprinte versie0-7803-7705-2
StatusPublished - 20 mei 2003
EvenementUnknown - Stockholm, Sweden
Duur: 21 sep 200925 sep 2009

Conference

ConferenceUnknown
Land/RegioSweden
StadStockholm
Periode21/09/0925/09/09

Bibliografische nota

IMTC/2003, Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference, Vail, Colorado, USA, 20-22 May, 2003, pp. 1303-1308

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