Charging Profile-Oriented Design for Reliability (DfR) Analysis of a WBG-based Multi-Use DC Charger Using a System-Level Electrothermal Model

Sajib Chakraborty; Hakan Polat; Gamze Egin Martin; Mohammed Mahedi Hasan; Omar Hegazy

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This paper presents a real-field charging profile-oriented optimal design approach. The proposed Design for Reliability (DfR) framework includes multi-objective optimization for selecting appropriate components, charging profile datasets (based on company charging session log), a virtual prototype platform consisting of system-level electrothermal models coupled with control functions, and reliability assessment models for lifetime metrics calculation. The results reveal that charging profiles significantly impact system wear-out failure. Meeting industry service target lifetime requirements may necessitate re-optimization of the charger system.

Originele taal-2	English
Pagina's	1-2
Aantal pagina's	2
Status	Published - 19 mei 2024
Evenement	47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies - Greece, Crete, Greece Duur: 19 mei 2024 → 23 mei 2024 https://wocsdice-exmatec-2024.eventsadmin.com/Home/Welcome

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Conference	47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies
Verkorte titel	(WOCSDICE-EXMATEC 2024)
Land/Regio	Greece
Stad	Crete
Periode	19/05/24 → 23/05/24
Internet adres	https://wocsdice-exmatec-2024.eventsadmin.com/Home/Welcome

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Chakraborty, S., Polat, H., Egin Martin, G., Hasan, M. M., & Hegazy, O. (2024). Charging Profile-Oriented Design for Reliability (DfR) Analysis of a WBG-based Multi-Use DC Charger Using a System-Level Electrothermal Model. 1-2. Abstract van 47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies , Crete, Greece.

Chakraborty, Sajib ; Polat, Hakan ; Egin Martin, Gamze et al. / Charging Profile-Oriented Design for Reliability (DfR) Analysis of a WBG-based Multi-Use DC Charger Using a System-Level Electrothermal Model. Abstract van 47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies , Crete, Greece.2 blz.

@conference{e9008281da6b495788d7a7523a872002,

title = "Charging Profile-Oriented Design for Reliability (DfR) Analysis of a WBG-based Multi-Use DC Charger Using a System-Level Electrothermal Model",

abstract = "This paper presents a real-field charging profile-oriented optimal design approach. The proposed Design for Reliability (DfR) framework includes multi-objective optimization for selecting appropriate components, charging profile datasets (based on company charging session log), a virtual prototype platform consisting of system-level electrothermal models coupled with control functions, and reliability assessment models for lifetime metrics calculation. The results reveal that charging profiles significantly impact system wear-out failure. Meeting industry service target lifetime requirements may necessitate re-optimization of the charger system.",

author = "Sajib Chakraborty and Hakan Polat and {Egin Martin}, Gamze and Hasan, {Mohammed Mahedi} and Omar Hegazy",

year = "2024",

month = may,

day = "19",

language = "English",

pages = "1--2",

note = "47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies , (WOCSDICE-EXMATEC 2024) ; Conference date: 19-05-2024 Through 23-05-2024",

url = "https://wocsdice-exmatec-2024.eventsadmin.com/Home/Welcome",

}

Chakraborty, S, Polat, H, Egin Martin, G , Hasan, MM & Hegazy, O 2024, 'Charging Profile-Oriented Design for Reliability (DfR) Analysis of a WBG-based Multi-Use DC Charger Using a System-Level Electrothermal Model', 47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies , Crete, Greece, 19/05/24 - 23/05/24 blz. 1-2.

Charging Profile-Oriented Design for Reliability (DfR) Analysis of a WBG-based Multi-Use DC Charger Using a System-Level Electrothermal Model. / Chakraborty, Sajib; Polat, Hakan; Egin Martin, Gamze et al.
2024. 1-2 Abstract van 47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies , Crete, Greece.

Onderzoeksoutput: Unpublished abstract

TY - CONF

T1 - Charging Profile-Oriented Design for Reliability (DfR) Analysis of a WBG-based Multi-Use DC Charger Using a System-Level Electrothermal Model

AU - Chakraborty, Sajib

AU - Polat, Hakan

AU - Egin Martin, Gamze

AU - Hasan, Mohammed Mahedi

AU - Hegazy, Omar

PY - 2024/5/19

Y1 - 2024/5/19

N2 - This paper presents a real-field charging profile-oriented optimal design approach. The proposed Design for Reliability (DfR) framework includes multi-objective optimization for selecting appropriate components, charging profile datasets (based on company charging session log), a virtual prototype platform consisting of system-level electrothermal models coupled with control functions, and reliability assessment models for lifetime metrics calculation. The results reveal that charging profiles significantly impact system wear-out failure. Meeting industry service target lifetime requirements may necessitate re-optimization of the charger system.

AB - This paper presents a real-field charging profile-oriented optimal design approach. The proposed Design for Reliability (DfR) framework includes multi-objective optimization for selecting appropriate components, charging profile datasets (based on company charging session log), a virtual prototype platform consisting of system-level electrothermal models coupled with control functions, and reliability assessment models for lifetime metrics calculation. The results reveal that charging profiles significantly impact system wear-out failure. Meeting industry service target lifetime requirements may necessitate re-optimization of the charger system.

M3 - Unpublished abstract

SP - 1

EP - 2

T2 - 47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies

Y2 - 19 May 2024 through 23 May 2024

ER -

Chakraborty S, Polat H, Egin Martin G , Hasan MM , Hegazy O. Charging Profile-Oriented Design for Reliability (DfR) Analysis of a WBG-based Multi-Use DC Charger Using a System-Level Electrothermal Model. 2024. Abstract van 47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies , Crete, Greece.

Charging Profile-Oriented Design for Reliability (DfR) Analysis of a WBG-based Multi-Use DC Charger Using a System-Level Electrothermal Model

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