High Accuracy Location of Faults on Electrical Lines Using Digital Processing of Sampled Data Records from a Reflectogram

Leo Van Biesen, Jean Renneboog, Alain Barel

Onderzoeksoutput: Conference paper

6 Citaten (Scopus)
Originele taal-2English
TitelConference record of the IEEE Instrumentation and Measurement Technology Conference, Washington, DC (USA), April 25-27, 1989, pp. 462-466
StatusPublished - 1989
EvenementUnknown -
Duur: 1 jan 1989 → …

Conference

ConferenceUnknown
Periode1/01/89 → …

Bibliografische nota

Conference record of the IEEE Instrumentation and Measurement Technology Conference, Washington, DC (USA), April 25-27, 1989, pp. 462-466

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